Advances in Precious Metal Trace Element Analyses for Deportment using LAM-ICP-MS

Canadian Institute of Mining, Metallurgy and Petroleum
Louis J. Cabri Yeonuk Choi Mike Nelson Mike Tubrett Paul J. Sylvester
Organization:
Canadian Institute of Mining, Metallurgy and Petroleum
Pages:
16
File Size:
819 KB
Publication Date:
Jan 1, 2010

Abstract

"The development and characterization of sulphide standards containing as many as seven precious metals has increased the efficiency and comprehensiveness of micro-analyses for deportment studies using laser ablation microprobe inductively coupled plasma mass spectrometry (LAM-ICPMS). Because trace precious metals occurring in solid solution or as sub-micron inclusions in sulphides, arsenides, and sulpharsenides are often heterogeneously distributed, a significantly large number of analyses are required. Using well-prepared samples it is possible for up to 120 analyses per day, far more than by other comparable methods. Examples will be discussed from projects focused on the deportment of Au and the platinum group elements (PGE).INTRODUCTIONBecause gold and the platinum-group elements (PGE) occur as both discrete minerals and in trace quantities in a variety of minerals (mostly sulphide, arsenide, and sulpharsenide minerals), specialized trace analytical methods were developed and applied to determine the deportment of precious metals in ore deposits, requiring sensitivities ranging originally from about hundreds to presently tens of ppb for individual precious metal or less.In mineralogical studies, micro-analytical techniques such as the electron microprobe were first applied to obtain analyses for major elements in about 1959-60, but as the instrumentation improved early attempts for PGE in potential carrier minerals indicated that reasonable levels of detection (LOD) were of the order of 300-400 ppm, depending on analytical conditions, X-ray spectral lines, and mineral matrix (e.g., Cabri and Laflamme, 1976). Eventually, the lowest detection levels by electron probe micro-analyses (EPMA) obtained for some PGE were of the order of 10s of ppm using high accelerating voltage and current for extended measuring time on peak and background (Gervilla, Cabri, Kojonen, Oberthür, Weiser, Johanson, Sie, Campbell, Teesdale and Laflamme, 2004)."
Citation

APA: Louis J. Cabri Yeonuk Choi Mike Nelson Mike Tubrett Paul J. Sylvester  (2010)  Advances in Precious Metal Trace Element Analyses for Deportment using LAM-ICP-MS

MLA: Louis J. Cabri Yeonuk Choi Mike Nelson Mike Tubrett Paul J. Sylvester Advances in Precious Metal Trace Element Analyses for Deportment using LAM-ICP-MS. Canadian Institute of Mining, Metallurgy and Petroleum, 2010.

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