Aging Behaviour in Ni0.5CoxMn2.5-xO4 (x = 0.5, 0.8 and 1.1) Thermistors

Negative temperature coefficient (NTC) thermistors are required to have good electrical stability for many domestic and industrial applications. The aging phenomenon of NTC thermistors can be described as the change in electrical resistance due to thermal stress with time. In this study, Ni0.5CoxMn2.5−xO4 (x = 0.5, 0.8 and 1.1) ceramics were fabricated by the conventional solid-state reaction method. The powder mixtures of manganese, cobalt and nickel oxides were ball-milled for 5 h. The powders were calcinated at 900 °C for 2 h. The samples were sintered at 1100 °C for 5 h. To investigate the aging behaviour, the samples were held at 150 °C for 400 h. Aging in the samples were calculated by the following equation; ΔR/R0 = (R − R0)/R0 in which R0 is the resistance at 25 °C before the aging test, and R is the resistance at 25 °C after the aging test.