Force measurement using atomic force microscopy (AFM) to investigate the surface chemistry of mineral flotation, M. Tian, W. Hu, L. Xie, X. Cui, W. Sun, Y. Hu, J.W. Drelich, H. Zeng, and Z. Gao

The Southern African Institute of Mining and Metallurgy
M. Tian W. Hu L. Xie X. Cui W. Sun Y. Hu J. W. Drelich H. Zeng Z. Gao
Organization:
The Southern African Institute of Mining and Metallurgy
Pages:
10
File Size:
1304 KB
Publication Date:
Jan 1, 2020

Abstract

Flotation is a mineral separation technology that uses the surface hydrophobic difference of valuable minerals and their associated gangue minerals to separate them. The flotation collector adsorbs on the valuable mineral surface to improve its hydrophobicity, and metal ions are usually used as activators to enhance the collector adsorption. Different mineral surfaces show different charging properties and adsorption behaviours with the collector or metal ions. Moreover, the order of adding metal ions and the collector also show significant and different flotation performance for the same mineral. The adsorption or flotation behaviour or both are governed by mineral surface chemistry, such as surface charging and reactivity. In our recent studies, force measurement using atomic force microscopy (AFM) was employed to study the surface charging and adsorption mechanism of metal ions and collectors. By preparing collector-functionalised AFM tips, AFM can directly measure the adsorption strength of the collector on the mineral surface to determine the anisotropy of mineral surface reactivity. The preparation of collector-functionalised AFM tips provides the foundation for further study of the activation role of metal ion in the collector adsorption. The application of AFM for force measurement in the surface chemistry of mineral flotation can provide important information on developing flotation reagents and lays the foundation for the specific regulation of mineral surface characteristics. Keywords: Scheelite; flotation; surface chemistry; AFM force measurement
Citation

APA: M. Tian W. Hu L. Xie X. Cui W. Sun Y. Hu J. W. Drelich H. Zeng Z. Gao  (2020)  Force measurement using atomic force microscopy (AFM) to investigate the surface chemistry of mineral flotation, M. Tian, W. Hu, L. Xie, X. Cui, W. Sun, Y. Hu, J.W. Drelich, H. Zeng, and Z. Gao

MLA: M. Tian W. Hu L. Xie X. Cui W. Sun Y. Hu J. W. Drelich H. Zeng Z. Gao Force measurement using atomic force microscopy (AFM) to investigate the surface chemistry of mineral flotation, M. Tian, W. Hu, L. Xie, X. Cui, W. Sun, Y. Hu, J.W. Drelich, H. Zeng, and Z. Gao. The Southern African Institute of Mining and Metallurgy, 2020.

Export
Purchase this Article for $25.00

Create a Guest account to purchase this file
- or -
Log in to your existing Guest account