Force measurement using atomic force microscopy (AFM) to investigate the surface chemistry of mineral flotation, M. Tian, W. Hu, L. Xie, X. Cui, W. Sun, Y. Hu, J.W. Drelich, H. Zeng, and Z. Gao

- Organization:
- The Southern African Institute of Mining and Metallurgy
- Pages:
- 10
- File Size:
- 1304 KB
- Publication Date:
- Jan 1, 2020
Abstract
Flotation is a mineral separation technology that uses the surface hydrophobic difference of
valuable minerals and their associated gangue minerals to separate them. The flotation collector adsorbs
on the valuable mineral surface to improve its hydrophobicity, and metal ions are usually used as
activators to enhance the collector adsorption. Different mineral surfaces show different charging
properties and adsorption behaviours with the collector or metal ions. Moreover, the order of adding
metal ions and the collector also show significant and different flotation performance for the same
mineral. The adsorption or flotation behaviour or both are governed by mineral surface chemistry, such
as surface charging and reactivity. In our recent studies, force measurement using atomic force
microscopy (AFM) was employed to study the surface charging and adsorption mechanism of metal
ions and collectors. By preparing collector-functionalised AFM tips, AFM can directly measure the
adsorption strength of the collector on the mineral surface to determine the anisotropy of mineral surface
reactivity. The preparation of collector-functionalised AFM tips provides the foundation for further
study of the activation role of metal ion in the collector adsorption. The application of AFM for force
measurement in the surface chemistry of mineral flotation can provide important information on
developing flotation reagents and lays the foundation for the specific regulation of mineral surface
characteristics.
Keywords: Scheelite; flotation; surface chemistry; AFM force measurement
Citation
APA:
(2020) Force measurement using atomic force microscopy (AFM) to investigate the surface chemistry of mineral flotation, M. Tian, W. Hu, L. Xie, X. Cui, W. Sun, Y. Hu, J.W. Drelich, H. Zeng, and Z. GaoMLA: Force measurement using atomic force microscopy (AFM) to investigate the surface chemistry of mineral flotation, M. Tian, W. Hu, L. Xie, X. Cui, W. Sun, Y. Hu, J.W. Drelich, H. Zeng, and Z. Gao. The Southern African Institute of Mining and Metallurgy, 2020.