Mineral Identification Using A Scanning Electron Microscope

Quick, inexpensive and accurate mineral-phase identification is of utmost importance to applied mineralogists. The precise relationship between the intensity of measured backscattered electrons in a scanning electron microscope and the average atomic number of the specimen is still argued. Nevertheless, much can be gained by using backscattered electron images to identify mineral phases in a specimen. An application was developed to facilitate this method and makes it a practical, inexpensive and valuable option in many mineralogical investigations. Keywords: Mineral identification, Scanning electron microscope, Backscattered electron detectors