Part I – January 1969 - Communications - Computer Generation and Automatic Plotting of Electron Diffraction Patterns

THE use of digital methods for generating crystallo-graphic data is well-established and many programs are now available. Transmission electron microscopy usually requires a knowledge of the electron diffraction pattern which is obtained by plotting a planar section through reciprocal space. With cubic symmetry these sections are very easily produced, but with hexagonal and lower symmetry systems considerably more labor is involved. Johari and Buchanan1 have written a Fortran program for generating standard projections and along similar lines we have produced a short but completely general program for generating any section through reciprocal space. The required inputs are the lattice parameters and angles for the real crystal. The Miller indices of the direction [U, V, W] parallel to the electron beam are then specified and the program will generate the Miller indices of the plane normals perpendicular to [U, V,, W] up to some specified integer. A subroutine can be inserted to test for forbidden reflections if desired. We have used such routines for fct and hcp crystals. As each permitted index is generated it is printed or punched out and no storage arrays are utilized in the computer. The normal diffraction pattern corresponds to the zero-order Laue zone, but with thin crystals or crystals of large lattice parameters the higher-order Laue zones may contribute to the diffraction pattern. Accordingly the program will generate successive Laue zones and project them onto the zero-order zone. The output of the program first lists the zone axis [C, V, W] and the Laue zone, and then gives a list of permitted reflections and the corresponding XP and YP coordinates of the reciprocal lattice point in angstroms-'. In addition, ZP, the perpendicular distance of the reciprocal lattice point from the (U, V, Ur) plane in reciprocal space is given, as is the reciprocal interplanar spacing. In the case of the zero-order Laue zone ZP is zero. A diffraction spot from the higher-order Laue zones will be very slightly displaced from the computed coordinates as its position in an actual pattern is given by projection along the diffracted beam2 and not along [u, V, w]. For any given electron wavelength this correction could be readily incorporated into the program, but as it only amounts to -1 pct it was decided to leave the program in its most general form, i.e ., a computation of points