SEM-XMAP: Scanning Electron Microscopy and X-Ray Dot-Mapping Applied to Cemented Paste Backfill

Canadian Institute of Mining, Metallurgy and Petroleum
Serge Ouellet
Organization:
Canadian Institute of Mining, Metallurgy and Petroleum
Pages:
10
File Size:
887 KB
Publication Date:
May 1, 2007

Abstract

Identification and quantification of cementitious phases in cemented paste backfill (CPB) is difficult due to the fineness of tailings and the low binder content used in the mixture. Techniques such as X-ray diffraction and thermogravimetry were ineffective (mainly due to tailing mineral interference) to identify and quantify hydration products in most works reported in the literature. On the other hand, scanning electron microscopy (SEM) was used in many cases but mainly for qualitative purposes. This paper presents the development of a new approach based on a computer program (SEM-XMAP) that combines X-ray dot mapping images acquired by SEM and generates a coloured image representing the mineralogy and the microstructure of a given CPB specimen. The technique is applied to one CPB sample mixed with blast furnace slag (BFS) and acidic sulphated mixing water sampled in a mine dewatering system. The technique allowed identifying calcic matrix, unhydrated and partially hydrated BFS particles, and sulphated phases.
Citation

APA: Serge Ouellet  (2007)  SEM-XMAP: Scanning Electron Microscopy and X-Ray Dot-Mapping Applied to Cemented Paste Backfill

MLA: Serge Ouellet SEM-XMAP: Scanning Electron Microscopy and X-Ray Dot-Mapping Applied to Cemented Paste Backfill. Canadian Institute of Mining, Metallurgy and Petroleum, 2007.

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