Sims Study Of Adsorbed Collector Species On Mineral Surfaces

Secondary Ion Mass Spectroscopy (SIMS) was used to study adsorption of sulfide collectors such as modified thionocarbamates and thioureas, xanthate, dithiophosphate, and dithiophosphinate, on galena, chalcocite, chalcopyrite, and quartz under flotation related conditions. In the case of the adsorption of modified thiourea on chalcopyrite, chalcocite and Cu-activated quartz, and of dithiophosphinate on galena, SIMS measurements have provided direct evidence for the presence of metal-collector (1:1) complexes on surfaces. In the other systems, only the collector molecular ion and its fragments were detected. The distribution of adsorbed species on the surfaces was obtained by using SIMS in the imaging mode. On chalcopyrite, only the copper-collector complex was found; there was no evidence for iron-collector complex. In the case of quartz, adsorption of selective collectors was observed only after activation by copper ions.