Technical Notes - X-ray Microscopy of As-Grown and Deformed Single Crystals of Aluminum

- Organization:
- The American Institute of Mining, Metallurgical, and Petroleum Engineers
- Pages:
- 2
- File Size:
- 223 KB
- Publication Date:
- Jan 1, 1958
Abstract
IN making a study of the slip deformation and strain hardening of single crystals of aluminum, it has been found that considerable information additional to that provided by the usual metal-lographic techniques can be obtained by the use of the microfocus X-ray method described by Schulz.1 This technique has been applied to crystals both in the state as-grown by the strain-anneal method and after they have been subjected to increasing amounts of plastic strain. Kelly and Wei" have recently reported the use of this method for a study of lineage structure in aluminum single crystals grown from the melt. The crystals, prepared from aluminum of 99.99 pct purity supplied by British Aluminium Co. Ltd., were grown in the form of flat tensile specimens with a gage section of 0.3 by 0.1 in. and a gage length of 2.3 in. The microfocus X-ray tube used provided a focus of approximately 50 half width. Examination of a large number of as-grown crystals showed no sign of any macroscopic defects in the majority of cases. However, occasionally crystals grown by the strain-anneal method did show defects similar in nature to those shown by Kelly and Wei to occur in crystals grown from the melt. In some other cases a more regular appearance of black and white lines, corresponding to valleys and ridges, respectively, in the lattice, was obtained, Fig. 1. This particular crystal was slightly deformed as the lines when present in the image of an as-grown crystal are only barely visible. The angle of tilt of the blocks is of the order of 3. It seems likely that these tilt boundaries arise during the growth of the crystal due to the specimen not being perfectly flat on the hearth of the furnace and straightening under its own weight at the elevated temperatures. For the deformation studies the crystals were strained in a Polanyi-type tensile machine. A typical photograph taken after 1.2 pct elongation of a single crystal oriented with its axis fairly close to the center of the stereographic triangle is given in Fig. 2. The reflection, which is from the (111) planes, is traversed by two systems of parallel lines. These have been identified as traces of the primary (111) slip plane and the (110) plane perpendicular to the primary slip direction. The latter lines correspond to kink bands which could not be detected by the ordinary techniques of
Citation
APA:
(1958) Technical Notes - X-ray Microscopy of As-Grown and Deformed Single Crystals of AluminumMLA: Technical Notes - X-ray Microscopy of As-Grown and Deformed Single Crystals of Aluminum. The American Institute of Mining, Metallurgical, and Petroleum Engineers, 1958.