The Quantitative Determination of Sub-PPM Quantities of Au and Pt in Sulfide Minerals

The ion microprobe (dynamic SIMS technique) is a very sensitive instrument for the quantitative determination of trace concentrations of precious metals (often at the ppb level) occurring in common sulfide minerals, either chemically-bound or as discrete particles too small for resolution by SEM. The technique involves sputtering a 250 x 250 Jim area of the grains to a depth of about one ILm and analysing the secondary ions emitted from a circular central region in the sputter crater with a 62.5 I'm diameter. The combination of quantitative mineral-specific sub-ppm analyses together with depth-profiling and the ability to produce secondary ion maps of trace precious metals makes this a very powerful technique in quantifying the precious metal distribution in refractory and other sulfide ores and process products. The technique is particularly well-established for analysis of gold-and platinum-bearing ores and process products.